RADOS The technology and equipment for previous dressing of ores, slag
 Search  About Our news Equipment Support Technology Using Photo To a Customer
Education
Manuals
Software
Multimedia

Сontact info
Articles
Q&A
Glossary
Guest book
Partners


 Vacancies in Krasnoyarsk

SUPPORT

Glossary
   

A   B   C   D   Е   F   G   H   I   J   K   L   M   N   O   P   Q   R   S   T   U   V   W   X   Y   Z
   
X-RAY FLUORESCENCE (XRF)

Although more popularly known for its diagnostic use in the medical field, the use of x-rays forms the basis of many other powerful measurement techniques, including X-ray Fluorescence (XRF) Spectrometry.

XRF Spectrometry is used to identify elements in a substance and quantify the amount of those elements present to ultimately determine the elemental composition of a material. An element is identified by its characteristic X-ray emission wavelength ( ? ) or energy (E). The amount of an element present is quantified by measuring the intensity (I) of its characteristic emission.

All atoms have a fixed number of electrons (negatively charged particles) arranged in orbitals around the nucleus. Energy Dispersive (ED) XRF and Wavelength Dispersive (WD) XRF Spectrometry typically utilize activity in the first three electron orbitals, the K, L, and M lines, where K is closest to the nucleus.

In XRF Spectrometry, high-energy primary X-ray photons are emitted from a source (X-ray tube) and strike the sample. The primary photons from the X-ray tube have enough energy to knock electrons out of the innermost, K or L, orbitals. When this occurs, the atoms become ions, which are unstable. An electron from an outer orbital, L or M, will move into the newly vacant space at the inner orbital to regain stability. As the electron from the outer orbital moves into the inner orbital space, it emits an energy known as a secondary X-ray photon. This phenomenon is called fluorescence. The secondary X-ray produced is characteristic of a specific element. The energy (E) of the emitted fluorescent X-ray photon is determined by the difference in energies between the initial and final orbitals of the individual transitions.

This is described by the formula

where h is Planck's constant; c is the velocity of light; and ? is the characteristic wavelength of the photon.

Energies are inversely proportional to the wavelengths; they are characteristic for each element. For example the K? energy for Iron (Fe) is about 6.4keV. Typical spectra for EDXRF Spectrometry appear as a plot of Energy (E) versus the Intensity (I).

Support

Animated fragment, explaining X-rays radiometric separator work

!  Multimedia
New elaborations
New elaborations

Ore-control station Stark-M

Development of new technics, modernization and improvement of the made equipment   »

Articles

6g, pereulok Televisorny, Krasnoyarsk-660062, Russian Federation
tel/fax: +7 391 256-03-06, +7 391 258-11-63
e-mail: mail@rados.ru

©2003-2010 RADOS